2026-06-07T23:44:22Zhttps://docta.ucm.es/rest/oai/request

oai:docta.ucm.es:20.500.14352/533992023-09-07T15:35:47Zcom_20.500.14352_14col_20.500.14352_21

Zong, Yi Franco Peláez, Francisco Javier Agapito Serrano, Juan Andrés 2023-06-20T13:41:28Z 2023-06-20T13:41:28Z 2004-09-22 84-930056-1-4 https://hdl.handle.net/20.500.14352/53399 http://www.inta.es The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages. eng open access Using optimization techniques to characterize irradiated CMOS analog switches book part