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00925njm 22002777a 4500 dc Castaldini, A. author Cavallini, A. author Fraboni, B author Fernández Sánchez, Paloma author Piqueras De Noriega, Francisco Javier author 1998-02-15 The deep levels present in semiconducting CdTe and semi-insulating CdTe:Cl and Cd0.8Zn0.2Te have been investigated by means of cathodoluminescence, deep level transient spectroscopy (DLTS), photo-induced current transient spectroscopy, and photo-DLTS. The latter two methods, which can be applied to semi-insulating materials, allow to characterize the deep traps located up to midgap and can determine whether they are hole or electron traps. We have identified 12 different traps, some common to all the investigated samples, some peculiar to one of them. A comparison of the results obtained from the various materials is given and the status of defect models is reviewed. 0021-8979 10.1063/1.366946 https://hdl.handle.net/20.500.14352/59151 http://dx.doi.org/10.1063/1.366946 http://scitation.aip.org/ Deep energy levels in CdTe and CdZnTe