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Scanning electron acoustic microscopy of electronic materials Piqueras De Noriega, Francisco Javier 538.9 Signal Gaas Física de materiales © 1994 Published by Elsevier B.V. International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 93) - A NATO Advanced Research Workshop (3. 1993. Bolonia, Italia) Some scanning electron acoustic microscopy (SEAM) applications to the characterization of electronic materials are discussed. The specific problem of the observation of dislocations and dislocation-related features in GaAs is treated as an example of SEAM capability and limitations in the characterization of III-V compounds. However, SEAM is applied to study high T(c) superconductors. It is shown that evolution of the SEAM signal with temperature can provide information about structural changes above the critical temperature. Depto. de Física de Materiales Fac. de Ciencias Físicas TRUE pub 2023-06-20T19:07:25Z 2023-06-20T19:07:25Z 1994-05 journal article https://hdl.handle.net/20.500.14352/59275 0921-5107 10.1016/0921-5107(94)90329-8 metadata only access Elsevier Science SA