2026-06-29T07:42:18Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/713292024-06-11T13:50:34Zcom_20.500.14352_14col_20.500.14352_15
Docta Complutense
author
Clemente Barreira, Juan Antonio
author
Franco Peláez, Francisco Javier
author
Fabero Jiménez, Juan Carlos
author
Mecha López, Hortensia
author
Rezaei, Mohammadreza
author
Hubert, Guillaume
author
Martín Holgado, Pedro
2023-06-22T10:40:45Z
2023-06-22T10:40:45Z
2022-01-22
Clemente Barreira, J. A, et al. Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation. enero de 2022.
doi: https://hdl.handle.net/20.500.14352/71329.
0018-9499
10.1109/TNS.2022.3140473
https://hdl.handle.net/20.500.14352/71329
In aerospace industry, Commercial-Off-The-Shelf (COTS) Static Random Access Memories (SRAMs) are a cost-effective solution for obtaining high performance at the system level, which is difficult to obtain using space qualified components. Additionally, the usage of Dynamic Voltage Scaling (DVS) is commonly used in space environments, where low power consumption is a critical issue. This paper presents an analysis of the sensitivity against Single Event Upsets (SEUs) of various COTS bulk SRAMs and Advanced Low-Power SRAMs against proton radiation when using DVS to save power. Experimental results will show a clear evidence that the sensitivity to SEUs increases when the power is lowered. 2 sets of successive technologies (130-nm, 90-nm and 65-nm bulk SRAMs; and 150-nm and 110-nm A-LPSRAMs) are evaluated against 15~MeV protons and compared with results of 14~MeV neutrons presented in a previous work. Experimental data are finally compared with analytical simulations obtained by using the MUSCA-SEP3 Monte-Carlo tool to predict the effect of DVS on the SEE sensitivity on more modern technologies in the ITRS/IRDS roadmap.
eng
Attribution-NonCommercial-NoDerivatives 4.0 International
Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation
journal article
URL
https://docta.ucm.es/bitstreams/c938ae7e-e9ee-4578-a9fe-141b35fc97e9/download
File
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4c116d6c018c915ec57824ffd369cbc3
646364
application/pdf
_TNS2020__Impact_of_Dynamic_Voltage_Scaling_on_SEU_Sensitivity_of_COTS_Bulk_SRAMs_and_A_LPSRAMs_against_Proton_Radiation.pdf