2026-06-08T03:25:54Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/729032023-08-26T05:27:02Zcom_20.500.14352_14col_20.500.14352_15
Impact of High Particle Flux in Radiation Ground Tests with Protons
Rezaei, Mohammadreza
Martín Holgado, Pedro
Morilla García, Yolanda
Franco Peláez, Francisco Javier
Fabero Jiménez, Juan Carlos
Mecha López, Hortensia
Puchner, Helmut
Hubert, Guillaume
Clemente Barreira, Juan Antonio
COTS
SRAM
proton tests
radiation hardness
reliability
soft error
Electrónica (Física)
Radiactividad
Circuitos integrados
Electrónica (Informática)
Electrónica (Informática)
2203.07 Circuitos Integrados
2203 Electrónica
2203 Electrónica
This abstract presents an experimental study of the impact of using a high flux in radiation ground tests on the measured cross-section of SRAMs. Experimental results obtained with 15 MeV protons will show that using a high particle flux makes the measured cross-section increase by almost 1 order of magnitude.
Ministerio de Economía y Competitividad
Depto. de Estructura de la Materia, Física Térmica y Electrónica
Depto. de Arquitectura de Computadores y Automática
Fac. de Ciencias Físicas
Fac. de Informática
TRUE
pub
2023-06-22T12:35:55Z
2023-06-22T12:35:55Z
2022-08-22
journal article
https://hdl.handle.net/20.500.14352/72903
1609-0438
10.1109/RADECS50773.2020.9857721
eng
TIN2017-87237
ESP2015-68245-C4-4-P
open access
application/pdf
IEEE eXpress Conference Publishing