2026-06-27T10:23:07Zhttps://docta.ucm.es/rest/oai/requestoai:docta.ucm.es:20.500.14352/79602024-08-30T14:54:36Zcom_20.500.14352_14col_20.500.14352_15
Docta Complutense
author
Estandía, Saúl
author
Gazquez, Jaume
author
Dix, Nico
author
Varela Del Arco, María
author
Qian, Mengdi
author
Solanas, Raúl
author
Fina, Ignasi
author
Sánchez Barrera, Florencio
2023-06-17T09:01:31Z
2023-06-17T09:01:31Z
2021-03-14
2050-7526
10.1039/d0tc05853j
https://hdl.handle.net/20.500.14352/7960
http://dx.doi.org/10.1039/d0tc05853j
https://pubs.rsc.org/
Epitaxial orthorhombic Hf_(0.5)Zr_(0.5)O_2 (HZO) films on La_(0.67)Sr_(0.33)MnO_3 (LSMO) electrodes show robust ferroelectricity with high polarization, endurance and retention. However, no similar results have been achieved using other perovskite electrodes so far. Here, LSMO and other perovskite electrodes are compared. A small amount of orthorhombic phase and low polarization are found in HZO films grown on La-doped BaSnO_3 and Nb-doped SrTiO_3, while null amounts of orthorhombic phase and polarization are detected in films on LaNiO3 and SrRuO_3. The critical effect of the electrode on the stabilized phases is not a consequence of the differences in the electrode lattice parameter. The interface is critical, and engineering the HZO bottom interface on just a few monolayers of LSMO permits the stabilization of the orthorhombic phase. Furthermore, while the specific divalent ion (Sr or Ca) in the manganite is not relevant, reducing the La content causes a severe reduction of the amount of orthorhombic phase and the ferroelectric polarization in the HZO film.
eng
Atribución 3.0 España
Critical effect of the bottom electrode on the ferroelectricity of epitaxial Hf_0.5Zr_0.5O_2 thin films
journal article
URL
https://docta.ucm.es/bitstreams/3d726d71-e98d-4336-b36d-c17822772f6f/download
File
MD5
1fcd1b4e660b13927a8ca57eb92cce6b
4277326
application/pdf
VarelaArcoM 15 libre+CC.pdf