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      <dc:title>Overcoming the solid solubility limit of Te in Ge by ion implantation and pulsed laser melting recrystallization</dc:title>
      <dc:creator>Caudevilla Gutiérrez, Daniel</dc:creator>
      <dc:creator>Berencen, Y.</dc:creator>
      <dc:creator>Algaidy, Sari</dc:creator>
      <dc:creator>Zenteno Pérez, Francisco</dc:creator>
      <dc:creator>Olea Ariza, Javier</dc:creator>
      <dc:creator>San Andrés Serrano, Enrique</dc:creator>
      <dc:creator>García Hernansanz, Rodrigo</dc:creator>
      <dc:creator>Prado Millán, Álvaro Del</dc:creator>
      <dc:creator>Pastor Pastor, David</dc:creator>
      <dc:creator>García Hemme, Eric</dc:creator>
      <dc:description>©IEEE.
Spanish Conference on Electron Devices (CDE) (13.2021. Sevilla)
This work is part of the project TEC2017-84378-R, funded by MICINN and European Social Fund and project MADRID-PV2 (P2018/EMT-4308) funded by the Comunidad Autónoma de Madrid with the support from FEDER Funds. Parts of this research were carried out at IBC at the Helmholtz–Zentrum Dresden–Rossendorf e. V., a member of the Helmholtz Association. Authors would like to thank Ulrich Kentsch for his assistance with the lowtemperature implantations. D. Caudevilla would also acknowledge grant PRE2018-083798, financed by MICINN and European Social Fund. D. Pastor acknowledges financial support from the program Ramón y Cajal (Grant No. RYC2014-16936).</dc:description>
      <dc:description>Germanium hyperdoped with deep level donors,
such as tellurium, would lead to dopant-mediated sub-band gap mid-infrared photoresponse at room temperature. We use a
combination of non-equilibrium techniques to supersaturate Ge with Te via ion implantation followed by pulsed laser melting (PLM). Typically, liquid N2 (77K) temperatures are used to avoid implantation-induced Ge surface porosity. In this work, alternatively, we report on the use of slightly higher implantation temperatures (143 K) together with an amorphous Si (a-Si) capping layer. We demonstrate that the solid solubility limit of Te in Ge is overcome upon recovering the crystallinity of the material after laser processing.</dc:description>
      <dc:date>2023-06-17T09:16:09Z</dc:date>
      <dc:date>2023-06-17T09:16:09Z</dc:date>
      <dc:date>2021</dc:date>
      <dc:type>journal article</dc:type>
      <dc:identifier>2643-1300</dc:identifier>
      <dc:identifier>10.1109/CDE52135.2021.9455720</dc:identifier>
      <dc:identifier>https://hdl.handle.net/20.500.14352/8507</dc:identifier>
      <dc:identifier>https://doi.org/10.1109/CDE52135.2021.9455720</dc:identifier>
      <dc:identifier>https://ieeexplore.ieee.org/abstract/document/9455720?casa_token=jWEXAmngsWAAAAAA:D5oasqyYOWiTpd5FbDJ3EyF7w_5iXoYz7vWZPWDb_VecRARvsf8mkVGKecCXyZ-V_QBb9xxhjAs</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:relation>(TEC2017-84378-R; PRE2018-083798)</dc:relation>
      <dc:relation>MADRID-PV2 (P2018/EMT-4308)</dc:relation>
      <dc:relation>RYC- 2014-16936</dc:relation>
      <dc:rights>https://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights>
      <dc:rights>open access</dc:rights>
      <dc:rights>Atribución-NoComercial-SinDerivadas 3.0 España</dc:rights>
      <dc:publisher>IEEE</dc:publisher>
   </ow:Publication>
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