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https://hdl.handle.net/20.500.14352/98211.2/ore.xml 2024-02-02T11:38:48Z 2024-11-14T12:58:16Z Docta Complutense Time-dependent dielectric breakdown on subnanometer EOT nMOS FinFETs Feijoo, Pedro Carlos Kauerauf, Thomas Toledano-Luque, María Togo, Misuhiro San Andrés Serrano, Enrique Groeseneken, Guido. 2024-11-14T12:58:16Z ORIGINAL LICENSE THUMBNAIL TEXT