Rams, J.Plugaru, R.Piqueras de Noriega, Javier2023-06-202023-06-201999-12-27[1] A.G. Cullis, L.T. Canham, Nature 353 (1991) 335. [2] A.G. Cullis, L.T. Canham, P.D. Calcott, J. Appl. Phys. 82 (1997) 909. [3] T. Suzuki, T. Sakai, L. Zhang, Y. Nishiyama, Appl. Phys. Lett. 215 (1995) 66. [4] H. Mizuno, H. Koyama, N. Koshida, Appl. Phys. Lett. 69 (1996) 3779. [5] A.G. Cullis, L.T. Canham, G.M. Williams, P.W. Smith, O.D. Doser, J. Appl. Phys. 75 (1994) 493. [6] T. Mitsui, N. Yamamoto, K. Takemoto, O. Nittono, Jpn. J. Appl. Phys. 33 (1994) L342. [7] J. Piqueras, B. Méndez, R. Plugaru, G. Craciun, J.A. García, A. Remón, Appl. Phys. A 68 (1999) 329. [8] J. Rams, B. Méndez, G. Craciun, R. Plugaru, J. Piqueras, Appl. Phys. Lett. 74 (1999) 17280921-510710.1016/S0921-5107(99)00475-4https://hdl.handle.net/20.500.14352/59138© 1999 Elsevier Science S.A. This work has been supported by the DOES, under grant PB96-0639, CICYT (MAT98-1306-E), and by the Scientific Cooperation Programme between Spain and Romania.Cathodoluminescence of porous silicon after mechanical damage with a tip has been studied in the scanning electron microscope. Mechanical damage results in the exposure of new surfaces related to fracture and to small particles appearing over the porous silicon layer. The freshly generated surfaces caused an increase of several orders of magnitude in the luminescence efficiency.engjournal articlehttp://dx.doi.org/10.1016/S0921-5107(99)00475-4http://www.sciencedirect.comopen access538.9Física de materiales