Quiroga Mellado, Juan AntonioSánchez Brea, Luis MiguelGarcía Botella, ÁngelBernabeu Martínez, Eusebio2023-06-202023-06-202000-08-101. J. W. Coltman, “The specification of imaging properties by response to a sine wave input,” J. Opt. Soc. Am. 44, 468–471(1954). 2. G. C. Holst, CCD Arrays, Cameras, and Displays (Society for Photo-Optical Instrumentation Engineers, Bellingham, Wash., (1996). 3. S. Lai and G. von Bally, “Fringe contrast evaluation by means of histograms,” in OPTIKA ’98: 5th Congress on Modern Optics, G. Ákos, G. Lupkovics, and P. András, eds., Proc. SPIE 3573, 384–387 (1998). 4. J. D. Gaskill, Linear Systems, Fourier Transforms, and Optics (Wiley, New York, 1978). 5. A. Papoulis, Probability, Random Variables, and Stochastic Processes (McGraw-Hill, New York, 1965). 6. B. R. Frieden, Probability, Statistical Optics, and Data Testing (Springer-Verlag, Berlin, 1983). 7. T. Coleman, M. A. Branch, and A. Grace, Optimization Toolbox for Use with MATLAB, users guide version 2 (MathWorks, Natick, Mass., 1996). 8. A. Garcia-Botella, L. M. Sánchez-Brea, D. Vázquez-Molini, and E. Bernabeu, “Modulation transfer function for translucent rough sheet,” Appl. Opt. 38, 5429–5432 (1999).0003-693510.1364/AO.39.004098https://hdl.handle.net/20.500.14352/58788© 2000 Optical Society of America. Juan Antonio Quiroga acknowledges the support of a postdoctoral grant of the Universidad Complutense de Madrid and the Becas Internacionales Flores-Valles program, Spain, and Centro de Investigaciones en Óptica, León, México. Luis Miguel Sánchez-Brea acknowledges the support of a predoctoral grant of the Ministerio de Educación y Cultura (Intercambio de Personal Investigador entre Industrias y Centros Públicos de Investigación) with Kinossel S.L. This study was supported in part by Sainco Tráfico, S.A., in the framework of Proyecto de Estímulo a la Transferencia de Resultados de Investigación (PETRI) program, Baliza Luminosa para el Guiado de Tráfico Vial con Tecnología LED project of the Ministerio de Educación y Cultura.A histogram-based technique for robust contrast measurement is proposed. The method is based on fitting the histogram of the measured image to the histogram of a model function, and it can be used for contrast determination in fringe patterns. Simulated and experimental results are presented.engjournal articlehttp://dx.doi.org/10.1364/AO.39.004098http://www.opticsinfobase.orgopen access535OpticsÓptica (Física)2209.19 Óptica Física