Del Hoyo Muñoz, JesúsPorras, Joaquin AndresSoria García, ÁngelaSánchez Brea, Luis MiguelPastor Villarrubia, VeronicaHamdy Mohamed Elshorbagy, MahmoudAlda Serrano, Javier2024-05-232024-05-232024-05-02Del Hoyo, Jesus, et al. «Interferometric Method for Simultaneous Characterization of Retardance and Fast Axis of a Retarder». Optics and Lasers in Engineering, vol. 179, agosto de 2024, p. 108262. DOI.org (Crossref), https://doi.org/10.1016/j.optlaseng.2024.108262.0143-8166doi.org/10.1016/j.optlaseng.2024.108262https://hdl.handle.net/20.500.14352/104393Received 21 December 2023, Revised 4 April 2024, Accepted 23 April 2024, Available online 2 May 2024, Version of Record 2 May 2024. 2023 Acuerdos transformativos CRUE-CSIC. Authors acknowledge funding to “Nanorooms” PID2019-105918GB-I00 project (Proyectos de Generación de Conocimiento 2019) and “VDOEST” PID2022-138071OB-I00 project (Proyectos de Generación de Conocimiento 2022) from Ministerio de Ciencia e Innovación of Spain. Angela Soria-Garcia also acknowledges funding of a predoctoral fellowship from Universidad Complutense de Madrid and Banco Santander.In this work, we propose a technique to simultaneously measure the absolute retardance and the fast axis azimuth of a retarder using a Michelson interferometer with polarization control. One of the mirrors is slightly tilted to obtain interference fringes with collimated beams. The sample to measure is rotated and the parameters are obtained from the fringes displacement. The technique does not require the use of additional previously characterized retarders in the measurement process, but only linear polarizers. The experimental results present errors of the order of 2◦ for the retardance and 1◦ for the azimuth of the fast axis.engAttribution 4.0 Internationalhttp://creativecommons.org/licenses/by/4.0/journal article1873-0302https://doi.org/10.1016/j.optlaseng.2024.108262https://www.sciencedirect.com/science/article/pii/S0143816624002410?via%3Dihubopen access535.41535.417.2PolarimetryRetardanceFast axisRetarderInterferometryÓptica geométrica e instrumental2209 Óptica