Franco Peláez, Francisco JavierPalomar Trives, CarlosLiu, Shih FuLópez Calle, IsabelMaestro De La Cuerda, Juan AntonioAgapito Serrano, Juan Andrés2023-06-202023-06-202011978-1-4577-0585-410.1109/RADECS.2011.6131375https://hdl.handle.net/20.500.14352/45548©IEEE ©2012 Elsevier B.V ISSN : 0379-6566 European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc.engbook parthttp://dx.doi.org/10.1109/RADECS.2011.6131375http://ieeexplore.ieee.org/open access537.8Comparators (circuits)Integrated circuit testingLife testingRradiation hardening (electronics)Statistical analysisAnalog voltage comparatorsDigital programmable deviceDiscrete analog devicesIntegrated circuitsMemory elementsNatural radiation influenceOperational amplifiersScarce life testsSingle event transientsStatistical conclusionsVoltage referencesLogic gatesRandom access memoryAnalog devicesField testsLife testsVoltage comparatorElectrónica (Física)