Pal, U.Fernández Sánchez, PalomaPiqueras De Noriega, Francisco JavierSerrano, M. D.Diéguez, E.2023-06-202023-06-2019940-7503-0294-1https://hdl.handle.net/20.500.14352/60860© Iop Publishing Ltd. International Conference on Defect Recognition and Image Processing in Semiconductors and Devices (5. 1993. Santander, España)The nature of the 1.4eV band in CdTe is studied by cathodoluminescence. Results indicate that the band is not related only to surface defects.book partmetadata only access538.9EngineeringElectrical & ElectronicOpticsPhysicsMultidisciplinaryFísica de materiales