Schmidt, RainerCarrascoso Plana, FélixNemes, Norbert MarcelMompeán, FedericoGarcía-Hernández, Mar2024-01-182024-01-182022-02-27Schmidt, R.; Carrascoso Plana, F.; Nemes, N.M.; Mompeán, F.; García-Hernández, M. Impedance Spectroscopy of Encapsulated Single Graphene Layers. Nanomaterials 2022, 12, 804. https://doi.org/10.3390/nano1205080410.3390/nano12050804https://hdl.handle.net/20.500.14352/93789In this work, we demonstrate the use of electrical impedance spectroscopy (EIS) for the disentanglement of several dielectric contributions in encapsulated single graphene layers. The dielectric data strongly vary qualitatively with the nominal graphene resistance. In the case of sufficiently low resistance of the graphene layers, the dielectric spectra are dominated by inductive contributions, which allow for disentanglement of the electrode/graphene interface resistance from the intrinsic graphene resistance by the application of an adequate equivalent circuit model. Higher resistance of the graphene layers leads to predominantly capacitive dielectric contributions, and the deconvolution is not feasible due to the experimental high frequency limit of the EIS technique.engAttribution 4.0 Internationalhttp://creativecommons.org/licenses/by/4.0/journal article2079-4991https://doi.org/10.3390/nano12050804open access538.9Single-layer grapheneImpedance spectroscopyElectrode resistanceFísica del estado sólido2211 Física del Estado Sólido