Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques

Panin, G. N.Díaz-Guerra Viejo, CarlosPiqueras de Noriega, Javier2023-06-202023-06-201998-031026-3489https://hdl.handle.net/20.500.14352/59144Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniquesjournal articlemetadata only access538.9Si(111)2x1 SurfaceSpectroscopyCathodoluminescenceFísica de materiales