Díaz-Guerra Viejo, CarlosPiqueras De Noriega, Francisco Javier2023-06-202023-06-201999-08-150021-897910.1063/1.370982https://hdl.handle.net/20.500.14352/59135© 1999 American Institute of Physics. This work was supported by DGES through Project PB96-0639.A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques.engjournal articlehttp://dx.doi.org/10.1063/1.370982http://scitation.aip.orgopen access538.9Electronic-StructureSi(111)2x1 SurfaceGrain-BoundariesFísica de materiales