Méndez Martín, María BianchiPiqueras De Noriega, Francisco Javier2023-06-202023-06-201991-121155-433910.1051/jp4:1991644https://hdl.handle.net/20.500.14352/58996© Editions Physique. International Workshop on Beam Injection Assessment of defects in Semiconductors (2. 1991. Meudon, France )engjournal articlehttp://hal.archives-ouvertes.fr/docs/00/25/07/30/PDF/ajp-jp4199101C644.pdfhttp://hal.archives-ouvertes.fropen access538.9Física de materiales