Palomar Trives, CarlosLópez Calle, IsabelFranco Peláez, Francisco JavierGonzález Izquierdo, JesúsAgapito Serrano, Juan Andrés2023-06-202023-06-202011-09-19https://hdl.handle.net/20.500.14352/45920©2011, IEEE ISSN : 0379-6566 Print ISBN: 978-1-4577-0585-4 European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good candidate to develop power systems to be used in radiation environments.engconference paperhttp://dx.doi.org/10.1109/RADECS.2011.6131322open access537.8Integrated circuit testingLaser beam applicationsOperational amplifiersPower amplifiersRadiation effectsLaser testPower operational amplifierPower systemRadiation environmentsSingle event transientsJunctionsLasersPower suppliesResistorsTransient analysisTransistorsLaser irradiationOPA541Power devicesSingle-photon absorptionElectrónica (Física)Óptica (Física)Circuitos integrados2209.19 Óptica Física2203.07 Circuitos Integrados