Harris, V. G.Das,, B.N.Woicik, J. C.Crespo del Arco, PatriciaHemando, A.Garcia Escorial, A.2023-06-202023-06-201997-041155-433910.1051/jp4:19972168https://hdl.handle.net/20.500.14352/60117©Editions Physique.EDP Sciences. This research was carried out, in part, at the National Synchrotron Light Source (Brookhaven National Laboratories, Upton, NY), which is sponsored by the U.S. Department of Energy.A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitative treatment of crystallization and precipitation kinetics in thin films and multilayered structures.engjournal articlehttp://dx.doi.org/10.1051/jp4:19972168http://jp4.journaldephysique.orgopen access538.9Absorption fine-structureFcc Fe-CuMagnetic-propertiesFísica de materialesFísica del estado sólido2211 Física del Estado Sólido