Lucía Mulas, María LuisaSánchez Quesada, FranciscoSantamaría Sánchez-Barriga, JacoboSefrioui, ZouhairVarela del Arco, MaríaArias Serna, DiegoLoos, G.Navacerrada, M.A.2023-06-202023-06-201998-12-071) J. J. Randall and R. Ward, J. Am. Chem. Soc., 81, 2629 (1959). 2) R. J. Bouchard and J. L. Gillson, Mater. Res. Bull., 7, 837 (1972). 3) J. B. Goodenough, Czech. J. Phys., Sect. B, 17, 304 (1967). 4) J. M. Longo, P. M. Raccah, and J. B. Goodenough, J. Appl. Phys., 39, 1327 (1968). 5) L. Klein, J. S. Dodge, C. H. Ahn, G. J. Snyder, T. H. Geballe, M. R. Beasley, and A. Kapitulnik, Phys. Rev. Lett., 77, 2774 (1996). 6) L. Klein, J. S. Dodge, C. H. Ahn, J. W. Reiner, L. Miéville, T. H. Geballe, M. R. Beasley, and A. Kapitulnik, J. Phys.: Condens. Matter, 8, 10111 (1996). 7) L. Antognazza, K. Char, T. H. Geballe, L. L. H. King, and A. W. Sleight, Appl. Phys. Lett., 63, 1005 (1993). 8) C. H. Ahn, T. Tybell, L. Antognazza, K. Char, R. H. Hammond, M. R. Beasley, Ø. Fischer, and J.-M. Triscone, Science, 276, 1100 (1997). 9) T. Kiyama, K. Yoshimura, K. Kosuge, Y. Ikeda, and Y. Bando, Phys. Rev. B, 54, R756 (1996). 10) M. Shikano, T. Huang, Y. Inaguma, M. Itoh, and T. Nakamura, Solid State Commun., 90, 115 (1994). 11) L. Miéville, T. H. Geballe, L. Antognazza, and K. Char, Appl. Phys. Lett., 70, 126 (1997). 12) J. M. Valles, Jr., A. E. White, K. T. Short, R. C. Dynes, J. P. Garno, A. F. J. Levi, M. Anzlowar, and K. Baldwin, Phys. Rev. B, 39, 11599 (1989). 13) J.-P. Maria, S. Trolier-Mckinstry, D. G. Sholom, M. E. Hawley, and G. W. Brown, J. Appl. Phys., 83, 4373 (1998). 14) R. A. Rao, Q. Gan, C. B. Eom, R. J. Cava, Y. Suzuki, J. J. Krajewski, S. C. Gausepohl, and M. Lee, Appl. Phys. Lett., 70, 3035 (1997).0003-695110.1063/1.122772https://hdl.handle.net/20.500.14352/59339© American Institute of Physics. This work was supported by Comisión Asesora de la Investigación Científica y Técnica through Project Nos. MAT94-0604C0102 and Acción Especial (MAT 17/95). One of the authors (Z.S.) gratefully acknowledges financial support from Agencia Española de Cooperación Internacional (AECI).We have studied the effect of He+ irradiation on the electrical resistivity and Curie temperature of ferromagnetic SrRuO3 thin films. An evolution from metallic to insulating behavior is observed when He+ ion fluence is increased, suggesting a metal-insulator transition. Damage by ion irradiation produces a strong decrease of the Curie temperature. On the other hand, no significant change in T-c (similar to 160 K) takes place in fresh samples grown at different substrate temperatures. We discuss the possible correlation between structural changes induced by irradiation, which reflect in an increase of the pseudocubic lattice parameter, and the observed depression of T-c.engjournal articlehttp://dx.doi.org/10.1063/1.122772http://scitation.aip.org/open access537Itinerant Ferromagnet SrRuO3Thin-Films.ElectricidadElectrónica (Física)2202.03 Electricidad