Pal, U.Piqueras De Noriega, Francisco JavierFernández Sánchez, PalomaSerrano, M. D.Diéguez, E.2023-06-202023-06-2019942-86883-226-1https://hdl.handle.net/20.500.14352/60861© Editions Physique. International Congress on Electron Microscopy (13. 1994. París)Study of electronic deep levels in CdTe and CdTe:V by cathodoluminescence microscopybook partmetadata only access538.9Materials ScienceMultidisciplinaryMicroscopyFísica de materiales