Pal, UPiqueras De Noriega, Francisco JavierDutta, P. S.Bhat, H. L.Dubey, G. C.Kumar, V.Dieguez, E.2023-06-202023-06-2019961-55899-309-610.1557/PROC-406-537https://hdl.handle.net/20.500.14352/60858© Materials Research Soc. Symposium on Diagnostic Techniques for Semiconductor Materials Processing (2. 1995. Boston, USA)Cathodoluminescence spectroscopy for evaluation of defect passivation in GaSbbook parthttp://dx.doi.org/10.1557/PROC-406-537http://journals.cambridge.orgmetadata only access538.9Materials ScienceCharacterization & TestingFísica de materiales