Fernández Cañizares, FranciscoRodríguez Vázquez, JavierVeloso Ferreira, RafaelTenreiro Villar, IsabelRivera Calzada, Alberto CarlosFernando Saavedra, AmaliaSánchez García, Miguel A.Xie, YongCastellanos Gómez, AndrésVarela Del Arco, MaríaSánchez Santolino, Gabriel2026-02-052026-02-052025-12-21Fernandez-Canizares, Francisco, et al. «Automated Atomic Site Determination by Four-Dimensional Scanning Transmission Electron Microscopy Data Analytics». Ultramicroscopy, vol. 281, marzo de 2026, p. 114303. DOI.org (Crossref), https://doi.org/10.1016/j.ultramic.2025.114303.0304-399110.1016/j.ultramic.2025.114303https://hdl.handle.net/20.500.14352/131619© 2025 The Authors. PRE2022-101973. RYC2022-038027-I. CNS2024-154548. SITP-NLIST-ZD-2024-01.Automated atomic column detection and identification constitutes an active open front in advanced scanning transmission electron microscopy techniques. In this work we use clustering algorithms in combination with dimensionality reduction techniques to identify specific columns in a series of very different cutting-edge materials, ranging from ultrathin 2D materials to bulk semiconductors or complex oxides, which include different types of columns (heavy and light), and thus pose a challenge towards automated detection. By implementing a three-stage cascaded clustering pipeline, we are able to automatically identify all atomic column sites of our test materials and resolve them from the background interatomic space. This approach could enable new data-driven in-depth analysis of materials, allowing the automatic detection of chemical and structural characteristics of materials.engAttribution 4.0 Internationalhttp://creativecommons.org/licenses/by/4.0/journal article1879-2723https://doi.org/10.1016/j.ultramic.2025.11430341477944https://www-sciencedirect-com.bucm.idm.oclc.org/science/article/pii/S0304399125002013open access620.1004.8Scanning transmission electron microscopy4D-STEMConvergent beam electron diffractionDeep learningMachine learningFísica de materialesInteligencia artificial (Informática)2211 Física del Estado Sólido2203.04 Microscopia Electrónica1203.04 Inteligencia Artificial