Palomar Trives, CarlosLópez Calle, IsabelFranco Peláez, Francisco JavierAgapito Serrano, Juan AndrésGonzález Izquierdo, Jesús2023-06-192023-06-192013-02[1] I. Lopez-Calle, F. J. Franco, J. G. Izquierdo, & J. A. Agapito, "LASER System for Space Environment Emulation", IEEE Spanish Conference on Electron Devices, Palma de Mallorca (Spain), pp. 1-4, Feb 2011. [2] F. J. Franco, I. Lopez-Calle, J. G. Izquierdo, and J. A. Agapito, "Modification of the LM124 single event transients by load resistors," IEEE Transactions on Nuclear Science, vol. 57, no. 1, pp. 358-365, Feb. 2010. [3] F. Miller, "Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems", 7th RADECS, pp. 199-209, 2003.978-1-4673-4666-510.1109/CDE.2013.6481390https://hdl.handle.net/20.500.14352/35721©IEEE. E-ISBN : 978-1-4673-4667-2. Spanish Conference on Electron Devices (CDE)(9. 2013. Valladolid, España)This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.engbook parthttp://dx.doi.org/10.1109/CDE.2013.6481390http://ieeexplore.ieee.org/open access537.8SRAM chipsLaser beam effectsRadiation hardening (electronics)SRAMerror emulationLaser induced single eventsPulsed laserSemiconductor memorySensitivity mapSpace radiationMicroprocessorsPerformance evaluationPolymersRadiation effectsSemiconductor lasersSensitivityLaserMCUSEUErrorsMemoryElectrónica (Física)Óptica (Física)Circuitos integrados2209.19 Óptica Física2203.07 Circuitos Integrados