Quiroga Mellado, Juan AntonioMartínez Antón, Juan CarlosGonzález Moreno, Ricardo2023-06-202023-06-202004-11-15[1] J.C. Martínez-Antón, Determination of optical parameters in general film-substrate systems. A reformulation based on the concepts of envelope-extremes and local magnitudes, Appl. Opt. 39 (35) (2000) 4557–4568. [2] J.C. Martínez-Antón, O. Esteban, Photo-interferometric spectroscopic ellipsometry, Thin Solid Films 455–456 (2004), 90–94. [3] R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1977, pp. 283–285. [4] E.D. Palik, Handbook of Optical Constants of Solids, vol. 1, Academic Press, New York, 1985. [5] M. Malacara, M. Servín, Z. Malacara, Interferogram Analysis for Optical Testing, Marcel Dekker, 1998. [6] L.M. Sánchez-Brea, J.A. Quiroga, A. García-Botella, E. Bernabeu, Histogram-based method for contrast measurement, Appl. Opt. 39 (23) (2000) 4098–4106.0169-433210.1016/j.apsusc.2004.05.157https://hdl.handle.net/20.500.14352/50816© 2004 Elsevier B.V. International Meeting on Applied Physics (APHYS) (1ª. 2003. Badajoz). This work has obtained partial financial support from the project DPI.2001-1238 (MCYT, Spain).In this work we present an optical tool for characterizing the reflectance and polarimetric properties of surfaces. It uses only the image of the interference fringe pattern produced in a thin air-gap between the surface of interest and a glass surface acting as a reference. From only the contrast of the fringe pattern captured with a CCD we may obtain the reflectance of the surface, no need of measuring a reference beam. By taking two images with polarized light, we may get then the polarized reflectance R_p and R_s, but also the ellipsometric magnitude Δ, simply as a phase shift between fringes in p and s polarization. A sample of silicon with a thin layer of thermally grown silica is used to test the method.engjournal articlehttp://dx.doi.org/10.1016/j.apsusc.2004.05.157http://www.sciencedirect.comopen access535Photo-Interferometric Envelope AnalysisNewton RingsOptical CharacterizationSpectrophotometryÓptica (Física)2209.19 Óptica Física