Fabero Jiménez, Juan CarlosKorkian, GolnazFranco Peláez, Francisco JavierHubert, GuillaumeMecha López, HortensiaLetiche, ManonClemente Barreira, Juan Antonio2023-06-222023-06-222023-12-100141-933110.1016/j.micpro.2022.104743https://hdl.handle.net/20.500.14352/72824CRUE-CSIC (Acuerdos Transformativos 2022)This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx Artix-7 FPGA under different angles of incidence. Experimental results indicating SEUs on configuration RAM (CRAM) cells, Flip-Flops (FFs), and Block RAMs (BRAMs) are presented and discussed. Shapes of multiple events (ranging from 2 to 12-bit) are also analyzed, and their dependency on the incident angle of the particle beam against the device’s surface. Possible shapes of 128 and 384-bit multiple events are also investigated, revealing a trend to follow word lines. The results of the front incident angle are compared with 14.2-MeV neutrons, demonstrating a considerable difference in the device’s sensitivity against both irradiation sources. Finally, a modeling tool called MUSCA-SEP3 is used to predict the device’s sensitivity under the same environmental conditions. The obtained experimental results will show a good agreement with the predicted ones in a very accurate way.engAtribución-NoComercial-SinDerivadas 3.0 Españahttps://creativecommons.org/licenses/by-nc-nd/3.0/es/journal articlehttps://doi.org/10.1016/j.micpro.2022.104743https://reader.elsevier.com/reader/sd/pii/S0141933122002721?token=0CD966D6BB7218E65F48EBB616D066DB7F64C0A9E0913E8D85CD5FCF475C85A0D6142E88298F10359F94BA817D977A11&originRegion=eu-west-1&originCreation=20230516071802open accessFPGAThermal neutronsRadiation hardnessAngle of incidenceSoft errorCircuitos integrados2203.07 Circuitos Integrados