Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Mode

Fabero Jiménez, Juan CarlosMecha López, HortensiaFranco Peláez, Francisco JavierClemente Barreira, Juan AntonioKorkian, GolnazRey, SolenneCheymol, BenjaminBaylac, MaudHubert, GuillaumeVelazco, Raoul2023-06-162023-06-1620200018-949910.1109/TNS.2020.2977874https://hdl.handle.net/20.500.14352/6088A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and classified as cells of the configuration RAM, BRAM, or flip-flops. SBUs and MCUs with multiplicities ranging from 2 to 8 were identified using a statistical method. Possible shapes of multiple events are also investigated, showing a trend to follow wordlines. Finally, MUSCA SEP3 was used to make assesment for actual environments and an improvement of SEU injection test is proposed.engAtribución-CompartirIgual 3.0 Españahttps://creativecommons.org/licenses/by-sa/3.0/es/Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Modejournal articlehttps://ieeexplore.ieee.org/document/9020124https://doi.org/10.1109/TNS.2020.2977874open accessFPGAneutron testsradiation hardnessreliabilitysoft error.Electrónica (Física)RadiactividadCircuitos integradosElectrónica (Informática)Electrónica (Informática)2203.07 Circuitos Integrados2203 Electrónica2203 Electrónica