Rezaei, MohammadrezaMartín Holgado, PedroMorilla García, YolandaFranco Peláez, Francisco JavierFabero Jiménez, Juan CarlosMecha López, HortensiaPuchner, HelmutHubert, GuillaumeClemente Barreira, Juan Antonio2023-06-222023-06-222022-08-221609-043810.1109/RADECS50773.2020.9857721https://hdl.handle.net/20.500.14352/72903This abstract presents an experimental study of the impact of using a high flux in radiation ground tests on the measured cross-section of SRAMs. Experimental results obtained with 15 MeV protons will show that using a high particle flux makes the measured cross-section increase by almost 1 order of magnitude.engImpact of High Particle Flux in Radiation Ground Tests with Protonsjournal articlehttps://ieeexplore.ieee.org/xpl/conhome/9857595/proceedingopen accessCOTSSRAMproton testsradiation hardnessreliabilitysoft errorElectrónica (Física)RadiactividadCircuitos integradosElectrónica (Informática)Electrónica (Informática)2203.07 Circuitos Integrados2203 Electrónica2203 Electrónica