López Calle, IsabelFranco Peláez, Francisco JavierAgapito Serrano, Juan AndrésGonzález Izquierdo, Jesús2023-06-202023-06-202011-02-08978-1-4244-7863-710.1109/SCED.2011.5744202https://hdl.handle.net/20.500.14352/45552© IEEE. Spanish Conference on Electron Devices (CDE) (8.2011. Palma de Mallorca, España)One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.engbook parthttp://dx.doi.org/10.1109/SCED.2011.5744202http://ieeexplore.ieee.org/open access537.8Analogue circuitsCircuit reliabilityResistorsTransientsAnalog electronic devicesAnalog electronic systems reliabilityEnergetic ionsLoad resistorNetwork loadingSingle-event transientsSpatial missionsSpurious transientsWorst-case parameterOperational amplifiersSPICEShapeTransient analysisTransistorsVoltage measurementAnalog devicesBipolar technologyLaser testsSingle event transientsSystem reliabilityTwo-photon absorptionElectrónica (Física)Óptica (Física)Circuitos integrados2209.19 Óptica Física2203.07 Circuitos Integrados