Piqueras De Noriega, Francisco Javier2023-06-202023-06-201994-050921-510710.1016/0921-5107(94)90329-8https://hdl.handle.net/20.500.14352/59275© 1994 Published by Elsevier B.V. International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 93) - A NATO Advanced Research Workshop (3. 1993. Bolonia, Italia)Some scanning electron acoustic microscopy (SEAM) applications to the characterization of electronic materials are discussed. The specific problem of the observation of dislocations and dislocation-related features in GaAs is treated as an example of SEAM capability and limitations in the characterization of III-V compounds. However, SEAM is applied to study high T(c) superconductors. It is shown that evolution of the SEAM signal with temperature can provide information about structural changes above the critical temperature.journal articlehttp://dx.doi.org/10.1016/0921-5107(94)90329-8http://www.sciencedirect.commetadata only access538.9SignalGaasFísica de materiales