Martínez Antón, Juan CarlosAlonso Fernández, JoséGómez Pedrero, José Antonio2023-06-182023-06-182015-04-061094-408710.1364/OE.23.009494https://hdl.handle.net/20.500.14352/24645En Open Access en la web del editor.Optical profilometers based on light reflection may fail at surfaces presenting steep slopes and highly curved features. Missed light, interference and diffraction at steps, peaks and valleys are some of the reasons. Consequently, blind areas or profile artifacts may be observed when using common reflection micro-optical profilometers (confocal, scanning interferometers, etc…). The Topographic Optical Profilometry by Absorption in Fluids (TOPAF) essentially avoids these limitations. In this technique an absorbing fluid fills the gap between a reference surface and the surface to profile. By comparing transmission images at two different spectral bands we obtain a reliable topographic map of the surface. In this contribution we develop a model to obtain the profile under micro-optical observation, where high numerical aperture (NA) objectives are mandatory. We present several analytical and experimental results, validating the technique’s capabilities for profiling steep slopes and highly curved micro-optical surfaces with nanometric height resolution.engjournal articlehttps://doi.org/10.1364/OE.23.009494https://www.osapublishing.org/oe/abstract.cfm?uri=oe-23-7-9494restricted access681.7.03539.211InstrumentationMeasurementMetrologyOptical inspectionSurface measurementsMicro-optical devicesOptical profilometryÓptica (Física)Materiales ópticos2209.19 Óptica Física2209.14 Propiedad ópticas de los sólidos