Proceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Preface

Piqueras De Noriega, Francisco JavierCremades Rodríguez, Ana IsabelFernández Sánchez, PalomaMéndez Martín, María Bianchi2023-06-202023-06-202009-040749-603610.1016/j.spmi.2008.11.016https://hdl.handle.net/20.500.14352/43994©2008 Elsevier Ltd.engProceedings to the 9th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2008) held in Toledo, Spain, 29 June-3 July, 2008. Prefacejournal articlehttp://www.sciencedirect.com/science/journal/07496036/45/4-5http://www.sciencedirect.comrestricted access538.9Ray Photoelectron-SpectroscopyIn2o3OxidationDevicesFísica de materiales