Franco Peláez, Francisco JavierLópez Calle, IsabelGonzález Izquierdo, JesúsAgapito Serrano, Juan Andrés2023-06-202023-06-202010-020018-9499https://hdl.handle.net/20.500.14352/44473(c) 2010 IEEE. Personal use of this material is ermitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.engjournal articlehttp://dx.doi.org/10.1109/TNS.2009.2037894https://sites.google.com/site/fjfrancopelaez/http://pendientedemigracion.ucm.es/info/dinalaser/jesus.htmlhttp://ieeexplore.ieee.org/open access537SPICEOperational amplifiersResistorsLM124 Operational amplifierSPICE SimulationDistortionFeedback networkLaser testLoad effectLoad resistorSingle event transientsAbsorptionCritical currentLaser noiseOptical pulse generationPulse amplifiersShapeTestingLM124Laser irradiationLoad effectsOperational amplifierTwo-photon absorptionElectrónica (Física)Circuitos integrados2203.07 Circuitos Integrados