Pardo Llorente, Julio ÁngelPardo Llorente, LeandroPardo Llorente, María del Carmen2023-06-202023-06-2020060378-375810.1016/j.jspi.2004.08.008https://hdl.handle.net/20.500.14352/50237In this paper, we consider inference based on very general divergence measures under assumptions of a logistic regression model. We use the minimum phi-divergence estimator in a phi-divergence statistic, which is the basis of some new statistics, for solving the classical problems of testing in a logistic regression model. A diagnostic analysis is developed based on the new estimators and test statistics.engjournal articlehttp://www.sciencedirect.com/science/article/pii/S0378375804003441http://www.sciencedirect.comrestricted access519.22Logistic regression modelphi-divergence measureGoodness-of-fit testsModel diagnosticsEstadística matemática (Matemáticas)1209 Estadística