Pal, U.Piqueras De Noriega, Francisco JavierFernández Sánchez, PalomaSerrano, M. D.Diéguez, E.2023-06-202023-06-201994-09-150021-897910.1063/1.357442https://hdl.handle.net/20.500.14352/59271© 1994 American Institute of Physics. U. Pal thanks MEC for a post-doctoral research grant. This work has been supported by DGICYT (Project PB 90-1017).Cathodoluminescence in the scanning electron microscope has been used to investigate the relationship of point defects in CdTe and CdTe:V with luminescence bands at 1.40 and 1.13 eV. V has been found to inhibit the 1.40 eV luminescence. Annealing experiments indicate that Cd and Te vacancies are involved in the mentioned emission bands.engStudy of point defects in CdTe and CdTe:V by cathodoluminescencejournal articlehttp://dx.doi.org/10.1063/1.357442http://scitation.aip.orgopen access538.9PhysicsAppliedFísica de materiales