López Calle, IsabelFranco Peláez, Francisco JavierGonzález Izquierdo, JesúsAgapito Serrano, Juan Andrés2023-06-202023-06-202009-09-14978-1-4577-0492-510.1109/RADECS.2009.5994568https://hdl.handle.net/20.500.14352/45550© IEEE.© 2011 Elsevier B.V. ISSN : 0379-6566 E-ISBN : 978-1-4577-0493-2 European Conference on Radiation and its Effects on Components and Systems (RADECS 2009) (10. 2009. Bruges, Bélgica)Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.engbook parthttp://dx.doi.org/10.1109/RADECS.2009.5994568http://ieeexplore.ieee.org/open access537.8AbsorptionOperational amplifiersTwo-photon processesLM324TPA backside pulsed laser testUCMOperational amplifierSurface XY scanTwo-photon absorption backside pulsed laser testLasersMeasurement by laser beamPhotonicsRadiation effectsTransient analysisTransistorsLaserOperational AmplifiersSingle Event TransientsTwo-Photon TestsElectrónica (Física)Óptica (Física)Informática (Informática)Circuitos integrados2209.19 Óptica Física1203.17 Informática2203.07 Circuitos Integrados