Serna Galán, JulioNemes, George2023-06-202023-06-2020020277-786X10.1117/12.472381https://hdl.handle.net/20.500.14352/60695© (2003) SPIE--The International Society for Optical Engineering. Annual Boulder Damage Symposium on Optical Materials for High-Power Lasers (34ª. 2002. Boulder, Colorado, EE.UU.) / International Workshop on Laser Beam and Optics Characterization (7º. 2002. Boulder, Colorado, EE.UU.)The phase space analyzer is an optical device that uses slits, lenses and an irradiance-calibrated image detector in order to characterize optical beams. With such a device it is possible to obtain the beam power distribution along the two-dimensional phase space coordinates corresponding to a given transverse direction. The usual setup includes hard edge slits, and it has been considered in previous studies to measure stigmatic and simple astigmatic beams. We analyze a phase space analyzer with Gaussian slits to measure Gauss Schell-model beams. Special attention is given to general astigmatic beams (such as twisted irradiance and/or twisted phase beams), where a characterization along two orthogonal transverse axes is not enough.The phase space analyzer with Gaussian slitsbook parthttp://dx.doi.org/10.1117/12.472381http://proceedings.spiedigitallibrary.org/metadata only access535Materials ScienceCharacterization and TestingCoatings and FilmsOpticsPhysicsCondensed MatterÓptica (Física)2209.19 Óptica Física