Martínez Antón, Juan CarlosSiegmann, PhilipSánchez Brea, Luis MiguelGómez Pedrero, José AntonioCanabal Boutureira, Héctor AlfonsoBernabéu Martínez, EusebioHoefling, RolandJueptner, Werner P. O.Kujawinska, Malgorzata2023-06-202023-06-20© SPIE--Th2001Martinez Anton, J. C., Siegmann, P., Sánchez Brea, L. M. et al. «In-line detection and evaluation of surface defects on thin metallic wires». Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, vol. 4399, SPIE, 2001, pp. 27-34. www.spiedigitallibrary.org, https://doi.org/10.1117/12.445586.0-8194-4094-910.1117/12.445586https://hdl.handle.net/20.500.14352/60856We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.book parthttp://dx.doi.org/10.1117/12.445586http://proceedings.spiedigitallibrary.orgmetadata only access535Quality ControlWireConical ReflectionÓptica (Física)2209.19 Óptica Física