Lucía Mulas, María LuisaSánchez Quesada, Francisco2023-06-202023-06-202006-071098-012110.1103/PhysRevB.74.024507https://hdl.handle.net/20.500.14352/51240© The American Physical Society. This work was supported by the CICYT Grant No. BMF2001-1419, the ESF Network “Phi-shift,” the project DG236RIC “NDA” and the TRN “DeQUACS.”We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant epsilon(omega). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.engjournal articlehttp://dx.doi.org/10.1103/PhysRevB.74.024507http://journals.aps.org/open access537Grain-Boundary JunctionsElectromagnetic PropertiesHe+ IrradiationICRN-ProdcutsSuperconductorsInterfaceTransport.ElectricidadElectrónica (Física)2202.03 Electricidad