Quiroga Mellado, Juan AntonioVilla, J.Gómez Pedrero, José Antonio2023-06-202023-06-202002-110950-034010.1080/09500340210134701https://hdl.handle.net/20.500.14352/58776©2002 Taylor and Francis Ltd.A sinusoidal least-squares fitting algorithm (SLSF) is applied to temporal evaluation of fringe patterns. The least-squares fitting of a sine function directly with the irradiance fluctuations due to a linear sensitivity variation of the optical set-up avoids the problems inherent to Fourier analysis. Experiments show that the proposed method has a better noise immunity than the temporal Fourier method. An application of this technique to Deflectometry is also presented.journal articlehttp://dx.doi.org/10.1080/09500340210134701http://www.tandfonline.com/metadata only access535Speckle InterferometryShape MeasurementPhase EvaluationObjectsÓptica (Física)2209.19 Óptica Física