Plaza, J. L.Hidalgo Alcalde, PedroMéndez Martín, María BianchiPiqueras De Noriega, Francisco JavierDieguez, E.2023-06-202023-06-202002-04-30[1] W.H. Haydl, H.D. Müller, H. Ennen, W. Korber, K.W. Benz, Appl. Phys. Lett. 46 (9) (1985) 870. [2] L. Smentek, Phys. Rep. 297 (1998) 155. [3] A.G. Milnes, A.Y. Polyakov, Sol. Stat. Electron 36 (1993) 803. [4] O. Hildebrand, W. Kuebart, K.W. Benz, M.H. Pilkuhn, IEEE J. Quatum Electron QE-17 (1981) 284. [5] L.M. Frass, G.R. Girard, J.E. Avery, B.A. Arau, V.S. Sundaram, A.G. Thompson, J.M. Gee, J. Appl. Phys. 66 (1989) 3866. [6] G. Motosugi, T. Kagawa, Jpn. J. Appl. Phys. 19 (1980) 2303. [7] J.M. Zavada, D. Zhang, Sol. Stat. Electron 387 (1995) 1285. [8] P. Hidalgo, B. Mendez, J. Piqueras, J.L. Plaza, E. Dieguez, Semicond. Sci. Technol. 13 (1998) 1431. [9] P.S. Dutta, B. Mendez, J. Piqueras, E. Dieguez, H.L. Bhat, J. Appl. Phys. 80 (1996) 1112. [10] J.L. Plaza, Ph.D Thesis, Universidad Autonoma of Madrid (2001).0921-510710.1016/S0921-5107(01)01065-0https://hdl.handle.net/20.500.14352/58931© 2002 Elsevier Science B.V. International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (9. 2001. Ramini, Italia)The defect structure of Te-doped GaSb samples co-doped with Er_2O_3 and grown by the vertical Bridgman technique has been analysed. This study was carried out for different Er and Te concentrations. The defect structure of the samples has been analysed by means of cathodoluminescence (CL), scanning electron microscopy (SEM) and wavelength dispersive X-ray microanalysis (WDX). The effect of the defect structure and sample composition on the electrical properties of the material has been established taking into account the results obtained by means of the van der Pauw technique.engjournal articlehttp://www.sciencedirect.com/science/article/pii/S0921510701010650http://www.sciencedirect.comopen access538.9Física de materiales