Urbieta, S.Fernández Sánchez, PalomaPiqueras De Noriega, Francisco JavierVasco, E.Zaldo, C2023-06-202023-06-202003-010031-896510.1002/pssa.200306275https://hdl.handle.net/20.500.14352/51157© Wiley-V C H Verlag Gmbh. International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (EXMATEC 2002) (6. 2002. Budapest, Hungria).Highly (001) textured ZnO films grown on (100)InP by pulsed laser deposition have been studied by Scanning Tunneling Microscopy (STM). Constant current images show a well defined grain structure, which allows to perform local spectroscopic studies. From differential conductance spectra an asymmetry of the electrical properties at both sides of the boundaries can be observed, which can be attributed to the formation of space charge layers. On the other hand the electrical behavior, in particular the conduction type, differs from grain to grain, likely due to the different orientation of the faces exposed to the STM tip.journal articlehttp://dx.doi.org/10.1002/pssa.200306275http://onlinelibrary.wiley.commetadata only access538.9Microcrystallite Thin-FilmsRoom-TemperatureElectronic-StructureSi(111)2x1 SurfaceSpectroscopyVaristorsFísica de materiales