Franco Peláez, Francisco JavierVelazco, Raoul2023-06-202023-06-202007-01-311-4244-0868-710.1109/SCED.2007.384018https://hdl.handle.net/20.500.14352/53413©IEEE. Spanish Conference on Electron Devices (6.2007.Madrid). This work was supported by the NICRON Project (Fault-Tolerant Design and Verification for Safety-Critical Applications built from Advanced Integrated Circuits), in the frame of the ALFA (América Latina Formación Académica) cooperation agreement.This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.engbook parthttp://dx.doi.org/10.1109/SCED.2007.384018http://ieeexplore.ieee.org/open access537.8SRAM chipsLogic testingRadiation effectsSensitivitySEU evaluation boardSRAMCosmic ray interactionField test systemNatural radiation effectsSingle event upsetAtmosphereCosmic raysField programmable gate arraysLaboratoriesMicroprocessorsNeutronsPerformance evaluationRandom access memorySystem testingSRAMsSingle event effectsSoft error rateElectrónica (Física)RadiactividadCircuitos integrados2203.07 Circuitos Integrados