Zong, YiFranco Peláez, Francisco JavierHernández Cachero, AntonioAgapito Serrano, Juan AndrésFernandes, Ana C.Marques, José G.Rodríguez-Ruiz, Miguel ÁngelCasas-Cubillos, Juan2023-06-202023-06-202005-07-11https://hdl.handle.net/20.500.14352/53994© Copyright IEEE DOI: 10.1109/REDW.2005.1532679 ISBN: 0-7803-9367-8This paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period of watchdog timer. It was also observed that threshold voltage hysteresis and the shift of TTL trigger level appeared in some devices.engSupervisory circuits in a mixed neutron and gamma radiation environmentconference posterhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1532679open access537.8Gamma-ray effectsHysteresisIntegrated circuit testingMicroprocessor chipsNeutron effectsReference circuitsTTL trigger level shiftMicroprocessor supervisory circuitsMixed neutron-gamma radiation environmentSupply current increaseThreshold voltage hysteresisWatchdog timerCircuit testingClocksCryogenicsField programmable gate arraysGamma raysInductorsLarge Hadron ColliderMicroprocessorsNeutronsThreshold voltageElectrónica (Física)RadiactividadElectrónica (Informática)2203 Electrónica