Person:
Martín Apaolaza, Nirian

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First Name
Nirian
Last Name
Martín Apaolaza
URI
https://hdl.handle.net/20.500.14352/76377
Affiliation
Universidad Complutense de Madrid
Faculty / Institute
Comercio y Turismo
Department
Economía Financiera, Actuarial y Estadística
Area
Estadística e Investigación Operativa
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Author: Castilla González, Elena María × Subject: 519.2 ×

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    Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses
    (Quality and Reliability Engineering International, 2020) Balakrishnan, Narayanaswamy; Castilla González, Elena María; Martín Apaolaza, Nirian; Pardo Llorente, Leandro
    Introduced robust density-based estimators in the context of one-shot devices with exponential lifetimes under a single stress factor. However, it is usual to have several stress factors in industrial experiments involving one-shot devices. In this paper, the weighted minimum density power divergence estimators (WMDPDEs) are developed as a natural extension of the classical maximum likelihood estimators (MLEs) for one-shot device testing data under exponential lifetime model with multiple stresses. Based on these estimators, Wald-type test statistics are also developed. Through a simulation study, it is shown that some WMDPDEs have a better performance than the MLE in relation to robustness. Two examples with multiple stresses show the usefulness of the model and, in particular, of the proposed estimators, both in engineering and medicine.