Person:
Pérez Carrasco, María Jesús

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First Name
María Jesús
Last Name
Pérez Carrasco
Affiliation
Universidad Complutense de Madrid
Faculty / Institute
Óptica y Optometría
Department
Optometría y Visión
Area
Optica
Identifiers
UCM identifierORCIDScopus Author IDWeb of Science ResearcherIDDialnet ID

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    Association between central retinal thickness and low luminance visual acuity in early age-related macular degeneration
    (European Journal of Ophthalmology, 2020) Puell Marín, María Cinta; Hurtado Ceña, Francisco Javier; Pérez Carrasco, María Jesús; Contreras Martín, Inés
    Purpose/Aim: To examine whether central retinal thickness (CRT) is related to mesopic visual acuity (VA) and low luminance deficit (LLD, difference between photopic and mesopic VA) in eyes with early and intermediate age-related macular degeneration (AMD). Materials and Methods: In a cross-sectional study, 50 pseudophakic subjects older than 63 years were divided into three groups (no AMD, early AMD and intermediate AMD). Spectral domain optical coherence tomography (SD-OCT) was used to measure CRT in the 1 mm-central-area. Best-corrected distance VA was measured under photopic or mesopic luminance conditions and LLD calculated. Subjects were stratified by VA impairment to compare CRTs across these groups. Relationships were examined by stepwise multiple linear regression. Results: No significant differences in mean CRT, photopic and mesopic VA or LLD were detected between the groups no AMD, early AMD and intermediate AMD. However, mean CRTs were 20 microns and 18 microns thicker in the eyes with impaired mesopic VA (> 0.3 logMAR) and impaired LLD (⩾ 0.3 logMAR) compared to the eyes with non-impaired VA or LLD respectively (both p < 0.01). CRT and mesopic pupil size were independent predictors of mesopic VA (p = 0.001). CRT emerged as the only independent predictor of LLD (p = 0.004). Conclusions: Increased CRT was linked to worse retinal function when measured under mesopic conditions in eyes without AMD and eyes with early to intermediate AMD. SD-OCT imaging combined with VA measurements under low luminance conditions could be a useful tool to detect early AMD.