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Cathodoluminescence from mechanically cracked porous silicon

dc.contributor.authorRams, J.
dc.contributor.authorPlugaru, R.
dc.contributor.authorPiqueras De Noriega, Francisco Javier
dc.date.accessioned2023-06-20T19:01:58Z
dc.date.available2023-06-20T19:01:58Z
dc.date.issued1999-12-27
dc.description© 1999 Elsevier Science S.A. This work has been supported by the DOES, under grant PB96-0639, CICYT (MAT98-1306-E), and by the Scientific Cooperation Programme between Spain and Romania.
dc.description.abstractCathodoluminescence of porous silicon after mechanical damage with a tip has been studied in the scanning electron microscope. Mechanical damage results in the exposure of new surfaces related to fracture and to small particles appearing over the porous silicon layer. The freshly generated surfaces caused an increase of several orders of magnitude in the luminescence efficiency.
dc.description.departmentDepto. de Física de Materiales
dc.description.facultyFac. de Ciencias Físicas
dc.description.refereedTRUE
dc.description.sponsorshipDOES
dc.description.sponsorshipCICYT
dc.description.sponsorshipScientific Cooperation Programme between Spain and Romania
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/26364
dc.identifier.doi10.1016/S0921-5107(99)00475-4
dc.identifier.issn0921-5107
dc.identifier.officialurlhttp://dx.doi.org/10.1016/S0921-5107(99)00475-4
dc.identifier.relatedurlhttp://www.sciencedirect.com
dc.identifier.urihttps://hdl.handle.net/20.500.14352/59138
dc.issue.number2
dc.journal.titleMaterials Science and Engineering B-Solid State Materials for Advanced Technology
dc.language.isoeng
dc.page.final129
dc.page.initial126
dc.publisherElsevier Science Sa
dc.relation.projectIDPB96-0639,
dc.relation.projectIDMAT98-1306-E
dc.rights.accessRightsopen access
dc.subject.cdu538.9
dc.subject.ucmFísica de materiales
dc.titleCathodoluminescence from mechanically cracked porous silicon
dc.typejournal article
dc.volume.number68
dcterms.references[1] A.G. Cullis, L.T. Canham, Nature 353 (1991) 335. [2] A.G. Cullis, L.T. Canham, P.D. Calcott, J. Appl. Phys. 82 (1997) 909. [3] T. Suzuki, T. Sakai, L. Zhang, Y. Nishiyama, Appl. Phys. Lett. 215 (1995) 66. [4] H. Mizuno, H. Koyama, N. Koshida, Appl. Phys. Lett. 69 (1996) 3779. [5] A.G. Cullis, L.T. Canham, G.M. Williams, P.W. Smith, O.D. Doser, J. Appl. Phys. 75 (1994) 493. [6] T. Mitsui, N. Yamamoto, K. Takemoto, O. Nittono, Jpn. J. Appl. Phys. 33 (1994) L342. [7] J. Piqueras, B. Méndez, R. Plugaru, G. Craciun, J.A. García, A. Remón, Appl. Phys. A 68 (1999) 329. [8] J. Rams, B. Méndez, G. Craciun, R. Plugaru, J. Piqueras, Appl. Phys. Lett. 74 (1999) 1728
dspace.entity.typePublication
relation.isAuthorOfPublication68dabfe9-5aec-4207-bf8a-0851f2e37e2c
relation.isAuthorOfPublication.latestForDiscovery68dabfe9-5aec-4207-bf8a-0851f2e37e2c

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