Spatial characterization of light detectors with nanometric resolution

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dc.contributor.authorAlda, Javier
dc.contributor.authorLópez Alonso, José Manuel
dc.contributor.authorRico García, José María
dc.contributor.authorZoido Chamorro, Jesús Manuel
dc.contributor.authorBoreman, Glenn
dc.date.accessioned2023-06-20T12:40:43Z
dc.date.available2023-06-20T12:40:43Z
dc.date.issued2004-04-15
dc.descriptionInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XV; Orlando, FL; United States; 14 April 2004 through 15 April 2004. Copyright 2004 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
dc.description.abstractThe miniaturization of light detectors in the visible and infrared has produced devices with micrometric and sub-micrometric spatial features. Some of these spatial features are closely linked with the physical mechanism of detection. An example of these devices is an optical antennas. To spatially characterize optical antennas it is necessary to scan a probe beam on the plane of the optical antenna. The mapping of this response is then treated and analyzed. When the response of the antenna is monitorized at visible or near-infrared frequencies, a sub-micron scanning step is necessary. In this paper we show the experimental set-up of a measurement station having a spatial resolution of 50 nanometers. This station is devoted to spatially characterize micrometric detectors, and specially optical antennas. The origin of the uncertainties of the measurement protocol is shown and practically analyzed. This station is also applied for characterizing the temporal, spectral, and polarization sensitivity specifications of light detectors with the previously mentioned resolution.
dc.description.departmentSección Deptal. de Óptica (Óptica)
dc.description.facultyFac. de Óptica y Optometría
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia y Tecnología de España
dc.description.statuspub
dc.eprint.idhttps://eprints.ucm.es/id/eprint/46338
dc.identifier.doi10.1117/12.543979
dc.identifier.issn0277-786X
dc.identifier.officialurlhttp://dx.doi.org/10.1117/12.543979
dc.identifier.relatedurlhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/5407/0000/Spatial-characterization-of-light-detectors-with-nanometric-resolution/10.1117/12.543979.full
dc.identifier.urihttps://hdl.handle.net/20.500.14352/52186
dc.journal.titleProceedings of SPIE
dc.language.isoeng
dc.page.final235
dc.page.initial226
dc.publisherSPIE
dc.relation.projectIDTIC2001-1259
dc.rights.accessRightsopen access
dc.subject.cdu535.31
dc.subject.cdu535.374
dc.subject.cdu621.396.67
dc.subject.keywordLight detectors
dc.subject.keywordNanometric resolutions
dc.subject.keywordMicrometric detectors
dc.subject.keywordOptical antennas
dc.subject.keywordSpatial characterization
dc.subject.keywordLight polarization
dc.subject.keywordPhotodetectors
dc.subject.ucmÓptica geométrica e instrumental
dc.subject.ucmLáseres
dc.subject.unesco2209.06 Óptica geométrica
dc.subject.unesco2209.10 Láseres
dc.titleSpatial characterization of light detectors with nanometric resolution
dc.typejournal article
dc.volume.number5407
dspace.entity.typePublication
relation.isAuthorOfPublicatione52aef01-c246-4f9f-9cfd-d9dfb2a8ee79
relation.isAuthorOfPublicationf83d6ebf-28e1-4568-ac27-e4db5acfc6dd
relation.isAuthorOfPublicationac2a156e-8430-4642-b011-fa98c045fb34
relation.isAuthorOfPublication.latestForDiscoverye52aef01-c246-4f9f-9cfd-d9dfb2a8ee79
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