Interferometric method for simultaneous characterization of retardance and fast axis of a retarder

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dc.contributor.authorDel Hoyo Muñoz, Jesús
dc.contributor.authorPorras, Joaquin Andres
dc.contributor.authorSoria García, Ángela
dc.contributor.authorSánchez Brea, Luis Miguel
dc.contributor.authorPastor Villarrubia, Veronica
dc.contributor.authorHamdy Mohamed Elshorbagy, Mahmoud
dc.contributor.authorAlda Serrano, Javier
dc.date.accessioned2024-05-23T18:37:25Z
dc.date.available2024-05-23T18:37:25Z
dc.date.issued2024-05-02
dc.descriptionReceived 21 December 2023, Revised 4 April 2024, Accepted 23 April 2024, Available online 2 May 2024, Version of Record 2 May 2024. 2023 Acuerdos transformativos CRUE-CSIC. Authors acknowledge funding to “Nanorooms” PID2019-105918GB-I00 project (Proyectos de Generación de Conocimiento 2019) and “VDOEST” PID2022-138071OB-I00 project (Proyectos de Generación de Conocimiento 2022) from Ministerio de Ciencia e Innovación of Spain. Angela Soria-Garcia also acknowledges funding of a predoctoral fellowship from Universidad Complutense de Madrid and Banco Santander.
dc.description.abstractIn this work, we propose a technique to simultaneously measure the absolute retardance and the fast axis azimuth of a retarder using a Michelson interferometer with polarization control. One of the mirrors is slightly tilted to obtain interference fringes with collimated beams. The sample to measure is rotated and the parameters are obtained from the fringes displacement. The technique does not require the use of additional previously characterized retarders in the measurement process, but only linear polarizers. The experimental results present errors of the order of 2◦ for the retardance and 1◦ for the azimuth of the fast axis.
dc.description.departmentSección Deptal. de Óptica (Óptica)
dc.description.departmentDepto. de Óptica
dc.description.facultyFac. de Óptica y Optometría
dc.description.facultyFac. de Ciencias Físicas
dc.description.fundingtypeAPC financiada por la UCM
dc.description.refereedTRUE
dc.description.sponsorshipMinisterio de Ciencia e Innobsvión (ESpaña)
dc.description.sponsorshipUniversidad Complutense de Madrid
dc.description.sponsorshipBanco Santander
dc.description.statuspub
dc.identifier.citationDel Hoyo, Jesus, et al. «Interferometric Method for Simultaneous Characterization of Retardance and Fast Axis of a Retarder». Optics and Lasers in Engineering, vol. 179, agosto de 2024, p. 108262. DOI.org (Crossref), https://doi.org/10.1016/j.optlaseng.2024.108262.
dc.identifier.doidoi.org/10.1016/j.optlaseng.2024.108262
dc.identifier.essn1873-0302
dc.identifier.issn0143-8166
dc.identifier.officialurlhttps://doi.org/10.1016/j.optlaseng.2024.108262
dc.identifier.relatedurlhttps://www.sciencedirect.com/science/article/pii/S0143816624002410?via%3Dihub
dc.identifier.urihttps://hdl.handle.net/20.500.14352/104393
dc.issue.number108262
dc.journal.titleOptics and Lasers in Engineering
dc.language.isoeng
dc.publisherElsevier
dc.relation.projectIDinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-105918GB-I00/ES/NANOFOTONICA CON MICROOPTICA: OPTICA RESONANTE PARA SISTEMAS MICROOPTICOS/
dc.relation.projectIDinfo:eu-repo/grantAgreement/AEI/Proyectos de Generación de Conocimiento 2022/PID2022-138071OB-I00/ES/Elementos opticos difractivos vectoriales para ciencia y tecnología/VDOEST
dc.rightsAttribution 4.0 Internationalen
dc.rights.accessRightsopen access
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subject.cdu535.41
dc.subject.cdu535.417.2
dc.subject.keywordPolarimetry
dc.subject.keywordRetardance
dc.subject.keywordFast axis
dc.subject.keywordRetarder
dc.subject.keywordInterferometry
dc.subject.ucmÓptica geométrica e instrumental
dc.subject.unesco2209 Óptica
dc.titleInterferometric method for simultaneous characterization of retardance and fast axis of a retarder
dc.typejournal article
dc.type.hasVersionVoR
dc.volume.number179
dspace.entity.typePublication
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