Defining a strategy to perform life-tests with analog devices
| dc.book.title | Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS 2011 | |
| dc.conference.date | 19/09/2011-23/09/2011 | |
| dc.conference.place | Sevilla (Spain) | |
| dc.conference.title | Radiation and Its Effects on Components and Systems (RADECS), 2011 12th European Conference on | |
| dc.contributor.author | Franco Peláez, Francisco Javier | |
| dc.contributor.author | Palomar Trives, Carlos | |
| dc.contributor.author | Liu, Shih Fu | |
| dc.contributor.author | López Calle, Isabel | |
| dc.contributor.author | Maestro De La Cuerda, Juan Antonio | |
| dc.contributor.author | Agapito Serrano, Juan Andrés | |
| dc.date.accessioned | 2023-06-20T05:46:38Z | |
| dc.date.available | 2023-06-20T05:46:38Z | |
| dc.date.issued | 2011 | |
| dc.description | ©IEEE ©2012 Elsevier B.V ISSN : 0379-6566 European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España) | |
| dc.description.abstract | Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc. | |
| dc.description.department | Depto. de Estructura de la Materia, Física Térmica y Electrónica | |
| dc.description.faculty | Fac. de Ciencias Físicas | |
| dc.description.refereed | TRUE | |
| dc.description.sponsorship | Ministerio de Educación y Ciencia | |
| dc.description.status | pub | |
| dc.eprint.id | https://eprints.ucm.es/id/eprint/28935 | |
| dc.identifier.doi | 10.1109/RADECS.2011.6131375 | |
| dc.identifier.isbn | 978-1-4577-0585-4 | |
| dc.identifier.officialurl | http://dx.doi.org/10.1109/RADECS.2011.6131375 | |
| dc.identifier.relatedurl | http://ieeexplore.ieee.org/ | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14352/45548 | |
| dc.language.iso | eng | |
| dc.page.final | 98 | |
| dc.page.initial | 92 | |
| dc.page.total | 7 | |
| dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | |
| dc.relation.ispartofseries | European Space Agency -Publications- Esa Sp | |
| dc.relation.projectID | AYA2009-13300-C03-02 | |
| dc.rights.accessRights | open access | |
| dc.subject.cdu | 537.8 | |
| dc.subject.keyword | Comparators (circuits) | |
| dc.subject.keyword | Integrated circuit testing | |
| dc.subject.keyword | Life testing | |
| dc.subject.keyword | Rradiation hardening (electronics) | |
| dc.subject.keyword | Statistical analysis | |
| dc.subject.keyword | Analog voltage comparators | |
| dc.subject.keyword | Digital programmable device | |
| dc.subject.keyword | Discrete analog devices | |
| dc.subject.keyword | Integrated circuits | |
| dc.subject.keyword | Memory elements | |
| dc.subject.keyword | Natural radiation influence | |
| dc.subject.keyword | Operational amplifiers | |
| dc.subject.keyword | Scarce life tests | |
| dc.subject.keyword | Single event transients | |
| dc.subject.keyword | Statistical conclusions | |
| dc.subject.keyword | Voltage references | |
| dc.subject.keyword | Logic gates | |
| dc.subject.keyword | Random access memory | |
| dc.subject.keyword | Analog devices | |
| dc.subject.keyword | Field tests | |
| dc.subject.keyword | Life tests | |
| dc.subject.keyword | Voltage comparator | |
| dc.subject.ucm | Electrónica (Física) | |
| dc.title | Defining a strategy to perform life-tests with analog devices | |
| dc.type | book part | |
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| dspace.entity.type | Publication | |
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| relation.isAuthorOfPublication | 2112fcdc-ac71-46d6-9857-a935bbcbca87 | |
| relation.isAuthorOfPublication.latestForDiscovery | 662ba05f-c2fc-4ad7-9203-36924c80791a |
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